• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    In order to be able to easily check switchgear of different manufacturers and types, it is provided that a control unit (6) for a switching device (5) of the switchgear (4) via an adapter cable (11) with a tester (10), for the Examining the switching device (5) simulated, connected and the tester (10) from a memory unit (15) on the adapter cable (11) reads out configuration-specific data and the tester (10) so its required for the implementation of the test signal inputs (BE) and signal outputs (BA, AA) configured.
    公开号:AT516348A1
    申请号:T50716/2014
    申请日:2014-10-07
    公开日:2016-04-15
    发明作者:
    申请人:Omicron Electronics Gmbh；
    IPC主号:
    专利说明:

    Test arrangement and method for testing a switchgear
    The subject invention relates to a test arrangement for a switchgear comprising a control unit for a switchgear of the switchgear and a tester having a number of signal inputs and a number of signal outputs, wherein the control unit is connected to the tester via an adapter cable and the testing apparatus for the test simulates the switchgear and an associated method for preparing a test of a switchgear.
    In installations for the transmission or distribution of electrical energy, e.g. an electrical supply network, various safety devices are used. Typical safety devices are, for example, so-called reclosing devices (known under the English name Recloser) or disconnectors (known and demergic name Sectionalizer). A recloser monitors current and voltage of the individual phases of the electrical system, among each other, but also with respect to earth or Nulllei¬ter, and separates one or all phases when an electrical error, e.g. a high fault current due to a short circuit to ground of a phase is detected. After a ge¬wissen, preset time, the previously separate phase is switched on again. If the error is still present, the separation and reclosing is repeated for a pre-selected number of trials. A sectionalizer typically does not detect an electrical fault but disconnects electrical conduction due to other criteria, e.g. after a certain number of detected reclosing attempts by an upstream recloser. Also in electrical installations there are also electrical switches, such as e.g. Leistungsschal¬ter (also known as circuit breaker) for use. Generally, and in the following, such aforementioned devices are referred to as switching devices. A common feature of such switching devices is that they have a control unit which monitors and triggers the switching of the switching device on the basis of specific control input variables, typically measured currents, often together with measured voltages. The switching device is controlled via control output variables of the control unit, for example in the form of electrical signals on a control line.
    In order to ensure the proper functioning of a control unit of a switching device, it is provided that it is checked from time to time or at regular intervals. For this purpose, there are appropriate test equipment, which are connected via a test cable to the control unit and simulate the function of the switching device, e.g. a Schalt¬ action, the auxiliary switching contacts of a circuit breaker, etc. The switching device is separated from the control unit and replaced by the tester, which thus simulates the switching device. The problem with this is that there are a lot of manufacturers of switching
    Devices and control units are there, in addition to the most diverse electrical interfaces between these units, both in the number of pins in the pin assignment, spend. This implies that different adapter cables are necessary for the different electrical interfaces. It is therefore necessary for the test to stock a plurality of adapter cables in order to ever be able to establish a connection between the tester and the various control units. In addition, the signal inputs and outputs of the test apparatus 10, which may be both analog and digital, must be parameterized depending on the switching device and the control unit, for example the voltage levels used, the timing of particular signals, the logical content of a digital 0 or 1 , etc.
    With a signal output of the test device in the form of a binary output, for example, a switch auxiliary contact is simulated (open or closed position) and at a signal input of the test device in the form of a binary input, for example, a closing / opening command of the control unit is detected. The signals at the binary inputs are typically voltages which vary in amplitude as a function of the switching device to be simulated. Usually a DC voltage is used, which is either a Steuerklein¬ voltage (eg 24V) or a voltage that is supplied by a large capacity in the control unit (which usually provides a higher voltage, such as 48V, 155V or 240V), to directly actuate the DC coil in the circuit breaker. In the case of a door entry, e.g. a function and a Anrege¬ value (such as a voltage level) are assigned to this signal input of the tester.
    Moreover, in order to be able to simulate a switching device by the tester, parameters of the switching device in the tester must also be parameterized, for example tripping times, closing times, time delays of the auxiliary contacts, etc. For example, a signal at the binary input is usually less than 100 ms long, either as a trip or close signal. This trip or close command can be a single one for each phase (in the case of a polyphase switching device), but there can also be a trip and close for each phase individually if the switching device has this functionality. But also a temporal sequence of states of signal outputs of the tester in response to state changes of signal inputs may be configured. Previously, this necessary parameterization or configuration was done manually by a user of the tester and the user needed to know what to set up to perform a proper test of the controller. That is, the tester has a suitable I / O interface to an input / output device, e.g. A laptop, a tablet or an operating unit must be present in order to enter the required parameters and to be able to make the necessary settings. In addition, suitable software must also be installed on the input / output device in order to be able to configure the tester according to the requirements and to be able to carry out the simulation of the switching device.
    An improvement of the cumbersome configuration of a tester offers the DE 109 2012004 848 A1. Therein, a simulation device with a simulation module is described, wherein in the simulation module a firmware can be installed, in which the switch logic and the switch function of a switch to be tested is mapped. Furthermore, a configuration is stored in the simulation module, which identifies the type of switching device and defines an address for identification and assignment in the test software. The simulation device is connected to the switchgear via a plug-in module. The functional testing software is installed on an external computer connected to the simulation module via a wireless connection. This allows complete parameterization and configuration to be prepared and no longer has to be done manually. Sol¬len hereby different switching devices and the control unit to be tested needs but different connector modules and also differently configured Simulationsmo-modules for the various types of switchgear, or it must be installed for each test first necessary firmware on the simulation module.
    The US 7,259,565 B2 shows a method for testing a switchgear with a Schaltvor¬richtung and a control unit. Here, the configuration of the switchgear and the test parameters are stored in the control unit in a memory unit. A tester can be connected to the control unit and the tester reads out the configuration and the test parameters from the memory unit. The problem with this procedure is that the memory unit can only be read out with a test device provided for this purpose, since the manner in which the configuration and the test parameters are stored in the control unit and how they are read out are manufacturer-specific and as a rule not even publicly documented. This, in turn, means that a large number of different, manufacturer-specific testing devices would have to be kept in stock for various switching systems and for different manufacturers, which makes the testing of switchgear logistically very complicated.
    It is an object of the subject invention to provide a test arrangement and method which can easily test switchgear of various manufacturers and types.
    This object is achieved in accordance with the invention in that a storage unit is provided on the adapter cable on which configuration-specific data are stored and read out by the test apparatus and the test apparatus is designed to provide its signal inputs and signal outputs required for carrying out a test in accordance with the configuration-specific data to configure automatically. Thus, the fact is exploited that can be concluded on the basis of the adapter cable to the switching device of the switchgear. If configuration-specific data is now stored on the adapter cable, it can be read by the tester after the tester and the control unit have been connected to the adapter cable. This allows the tester to automatically configure itself with these configuration-specific data, which considerably reduces the effort required to perform a test, since no user intervention is necessary for the preparation. This can also avoid any errors in preparing the test, since the adapter cable fits only to a specific combination of control unit and switching device, whereby a false configuration of the tester is practically impossible.
    Depending on the design, a unique identifier of the adapter cable can be stored as configuration-specific data, which makes it possible to read configuration data associated with a configuration data memory for the configuration of required signal inputs and signal outputs. Alternatively, configuration data can also be stored directly in the memory unit as configuration-specific data.
    Particularly advantageous first configuration data for the configuration of at least one binary signal output of the tester are stored. This makes it possible to carry out a basic function test of the control unit in the simplest manner, without having to rely on external testing software and without having to configure any further signal input or signal outputs in a time-consuming manner. This can quickly make a statement as to whether the control unit works at all.
    By storing first configuration data for configuring at least one binary signal input of the tester, the scope of the basic functional test can be extended by also examining the interaction between the control unit and the simulated switching device in the form of the tester, ie mutual reaction. For a full functional test, all binary signal inputs and binary signal outputs of the test device are to be configured, which thus includes all the required trip, close and switch auxiliary contact lines which are provided on the real switching device 5. For a further parameter check it can be provided to store second configuration data for the configuration of at least one analog signal output of the test device. This also makes it possible to integrate currents and voltages of the switchgear into the test, which makes very extensive tests possible.
    The subject invention will be explained in more detail below with reference to Figures 1 to 5, which show by way of example, schematically and not limiting advantageous Ausgestal¬tungen the invention. It shows
    1 shows a known arrangement of a switchgear,
    2 shows an arrangement for testing the control unit of the switchgear,
    3 possible arrangements of a memory unit for storing konfigurationsspezi¬fische data on the adapter cable,
    4 shows a configured test arrangement with control unit and tester undFig.5 an exemplary sequence of a test of the switchgear.
    1 shows a part of an electrical supply network 1, in the exemplary embodiment shown, a 3-phase overhead line whose lines 3 are tensioned between masts 2 in a conventional manner. On the mast 2, a switchgear 4 is provided as a safety device, which consists of a switching device 5 and an associated control unit 6. The switching device 5 is, for example, a recloser or a sectionalizer as described at the beginning and is able to disconnect or connect at least one of the lines 3 by a switching operation triggered by the control unit 6. However, the invention is of course not limited to application in an electrical supply network 1 in the form of an overhead line, but may be used in any installation for the transmission or distribution of electrical energy with safety devices in the form of a switchgear 4 having a switching device 5 and an associated control unit 6.
    For this purpose, the switching device 5 is connected to the control unit 6 with a control connection 7 and a plug 8 at the end of the control connection 7. The control connection 7 generally includes a number of control lines for control input variables and control output variables of the control unit 6. Control input variables of the control unit 6 are, for example, measured variables of the system for transmitting or distributing electrical energy generated by the switching device 5 or measuring devices such as a power wall learning, are detected, in particular measured currents or voltages, and the control unit 6 are transmitted for evaluation. The control input variables typically include signals from any auxiliary contacts of the switching device 5 which signal a specific switching state (open, closed). Control output quantities of the control unit 6 are signals which are generated by the control unit 6, in particular in response to the control input variables, and with which the function of the switching device 5 is controlled, for example a switching action is triggered.
    To test the switchgear 4, the control connection 7 between the switching device 5 and the control unit 6 is disconnected by pulling the plug 8 of the control connection 7, as shown in FIG. It would also be possible that the switching device 5 is not connected to the control unit 6 before the test, for example, during initial startup. Then the separation of the control connection 7 would be omitted. This is quite often the case as the control units 6 are often parameterized prior to installation and then functionally tested with the tester 10 before being "fielded" and installed.
    The control unit 6 is ver¬bunden for testing with an adapter cable 11 with a test device 10, which simulates the switching device 5 in order to check the proper function and Para¬metrierung the control unit 6 of the switchgear 4 can. The adapter cable 11 is connected to a first connector 13 via an electrical interface 17 to the control unit 6. In this case, the plug 13 corresponds in its pin number, pin assignment and geometry to the requirements of the control unit 6. Common control units 6 here vary between 10 and 42 pins Gm (FIG. 3a) with a wide variety of pin assignments. Thus, for the various control units 6 (manufacturer, type, interface, year of manufacture, etc.) there are corresponding adapter cables 11. A second connector 14 at the other end of the adapter cable 11 connects the adapter cable 11 to the tester 10. For this purpose, a uniform electrical interface 16 with a defined number of pins Pn (FIG. 3a) and a defined pin assignment can be provided on the test apparatus 10. The pins Gm of the connection between control unit 6 and adapter cable 11 are thus transferred to the pins Pn with a uniform pin laying the interface 16 of the test apparatus 10, i. the pins Gm of the interface 17 at the control unit 6 are assigned to specific pins Pn on the test apparatus 10. Thus, any connection errors can be avoided from the outset, since the insertion of the connectors 13, 14 of the adapter cable 11 ensures correct assignment.
    To save costs, a long interface cable 12, e.g. with a length of ei¬nigen meters, be provided, which is inserted with one end in the test apparatus 10 and connected to the other end via a plug connection with the adapter cable 11, as shown in Figure 2. The interface cable 12 may also be omitted. By the Interfaceka¬bel 12 the interface 16 of the tester 10 is brought closer to the control unit 6, whereby the necessary length of the adapter cable 11 for the various control units 6 can be reduced, preferably to a length below one meter. Thus, only short adapter cables 11 of various types and only a single interface cable 12, possibly different length interface cables 12, must be kept in stock, which facilitates the overall logistics of the test.
    The testing device 10 thus serves to simulate or simulate the switching device 5. For this purpose, the testing device 10 has a number of signal inputs and signal outputs. Through the signal inputs, the tester receives control outputs from the control unit 6 and for the sensory inputs to the filter, if the receiver is not connected to the driver
    A switching device 5 typically has binary signal inputs and binary signal outputs. Switching actions are typically initiated via binary signal inputs, e.g. From the control unit 6. Here there may be separate signal inputs for a trip signal (ie opening the switching device 5) and for a close signal (ie closing the switching device 5). However, it is also possible to use only one binary signal input for trip and close. There are also switching devices 5 in which only one input for trip / close is used for all the phases present, and those in which one input for trip / close is used for each individual phase of the switching device 5. In addition, a switching device 5 as a rule has auxiliary switching contacts in order to signal the switching state of the switching device 5 via a binary signal output. Again, separate switch-auxiliary contacts may be provided for open and closed, as well as again for all phases together or individually for each phase. In addition, a switching device 5 also often has analog signal outputs at which measured values of current or voltage are transmitted. The test apparatus 10 for simulating the switching device 5 must therefore be configured in order to be able to simulate the signal inputs and signal outputs present in the switching device 5. Whereby not all signal inputs or signal outputs are necessarily required for a test and therefore not necessarily all have to be configured.
    Frequently, switching operations with switching signals of different polarity are indicated in switching device 5, thus e.g. +1 for Close and -1 for Trip, where 0 does not correspond to any switching action. This is also understood as a binary signal input in the sense of the present invention.
    In order for the testing device 10 to be able to emulate the switching device 5 for testing the switchgear 4, it requires configuration data KD in order to be able to set the test device 10 accordingly. The configuration data KD may include information of the electrical interface 17 of the control unit 6 and / or information of the function of the switching device 5. For the electrical interface 17, data such as the pin assignment of the pins G1... Gm on the plug 13, the voltage levels of various pins G1... Gm of the plug 13, information about analog or binary pins, the assignment of the pins G1 Gm of the plug 13 may be stored as a control input or control output, the assignment of the pins G1 ... Gm of the electrical interface 17 of the control unit 6 to pins P1 ... Pn of the interface 16 of the tester 10, etc. The switching times or switching delays of the switches of the switching device 5, nominal values of the switching device 5, such as, for example, the ratio of the current and voltage transformers, the type of converter (for example, conventional current transformers or Rogowski converters), can be used as configuration data KD. Transducer) and connected to the configuration of the
    Tester 10 such as the correct selection of the analog outputs AE and setting a maximum value for the protection of the control unit 6, etc., stored.
    A memory unit 15 is arranged on the adapter cable 11, which, as stated above, must be designed in a control unit-specific manner. The memory unit 15 can be provided at different locations of the adapter cable 11, as indicated in FIGS. 3 a to 3 c. For example, the memory unit 15 in the plug 14 for connecting the adapter cable 11 with the test device 10 (Fig.3a) or the interface cable 12 (Figure 2) vorgese¬hen. The memory unit 15 can also be arranged at any point of the adapter cable 11 between the two limiting plugs 13, 14 (FIG. 3 b) and can also be arranged on the plug 13 for connecting the adapter cable 11 to the control unit 6.
    The memory unit 15 can in this case be designed as desired and only has to be suitable for storing information. In the simplest case, the memory unit 15 could be used as a passable electrical component, e.g. as a resistance, be executed. If a defined interrogation voltage is applied to the electrical component, then it will respond with an electrical current depending on the component. Thus, e.g. various adapter cables 11 are easily identified. However, the memory unit 15 can also be embodied as an electronic memory module which digitally stores the information.
    The memory unit 15 only needs to be readable by the tester 10. For this purpose, a number of pins Pn-1, Pn of the interface 16 can be provided to the test apparatus 10 for reading out the storage unit 15, as indicated in FIG. 3a. For this purpose, corresponding lines Ln-1, Ln (also in the adapter cable 11) can be provided which connect the pins Pn-1, Pn to the memory unit 15. However, it is also possible to use lines of the adapter cable 11 which are required per se for checking the control unit 6, for example when the control unit 6 is previously switched to a readout mode.
    For reading out the memory unit 15, an arbitrary data transmission method can be implemented, optionally with an arbitrary data transmission protocol.
    Configuration-specific data, that is to say data describing the configuration and function of the switchgear 4, are stored in the memory unit 15. As configuration-specific data, above-mentioned configuration data KD (Fig. 3c), a unique identification ID of the adapter cable 11 (Fig. 3a) or a mixture thereof (Fig. 3b) may be stored.
    If configuration data KD is stored directly in the storage unit 15 as configuration-specific data, the test apparatus 10 reads out the configuration data KD and automatically configures itself with this configuration data KD.
    If an unambiguous identification ID of the adapter cable 11 is stored in the memory unit 15, the tester 10 reads this identification ID. For a particular switching device 5 there may be associated control units 6 from different manufacturers, but which must necessarily have the same electrical interface for the switching device 5. Thus, the same type Adapterka¬bel 11 can be used for these control units 15 different manufacturers. Certain configuration data KD required for the check may already be derived in part or even in its entirety from the cable type of the adapter cable 11, which is defined on the basis of the unique identification ID, without having to know the exact make of the control unit 6. For example, the allocation of the binary signal inputs and binary signal outputs on the test apparatus 10 and the timing settings do not depend on the type of the control unit 6, but only on the switching apparatus 5 to be simulated. cable 11 make certain basic settings on the test device 10. The identifier ID of the adapter cable 11 can therefore already be sufficient to set up the test apparatus 10 for basic functional tests.
    For this purpose, necessary configuration data KD of an identification ID of an adapter cable 11 can be stored in the test device 10 in a configuration data memory 18, which are then used after the identification ID has been read from the memory unit 15 in order to set up the test device 10 for testing the switchgear 4. However, the necessary configuration data KD assigned to an identification ID need not necessarily be stored directly in the test apparatus 10, but can also be stored in an external configuration data memory 18 assigned to the identification ID (as indicated in FIG. 4). , For this purpose, the test apparatus 10 can be connected via a data connection 19, such as e.g. a LAN, WLAN, Bluetooth, etc., connect to the configuration data memory 18 and read the gedig¬ten data to configure it.
    Of course, any mixture of these two methods is also conceivable, as certain configuration data KD are stored directly in the memory unit 15 and other configuration data KD are queried via the stored unique identification ID.
    The sequence of a test of a switchgear 4 with a switching device 5 and an associated control unit 6 can proceed as follows with reference to FIGS. 4 and 5, it being already assumed that the test device 10 is described above with an adapter cable 11 is connected to the control unit 6 (step S1).
    In the storage unit 15 of the adapter cable 11, there is deposited an identification ID which uniquely identifies the type of the adapter cable 11. The test apparatus 10 stores the configuration data KD for all available adapter cables 11 and the assignment to the unique identifications ID in the configuration data memory 18 (eg which pins are used on the electrical interface 16, 17 and how they are assigned, voltage levels, power switch auxiliary contact times , etc.) · If the tester 10 is turned on, the tester 10 automatically reads out the ID from the memory unit 15 and, for example, in the tester 10, a switch simulator, here, for example a circuit breaker simulator at a circuit breaker as a switching device 5, and therefore started based on the first configuration data KD1 stored for identification ID the binary signal inputs BE (possibly also only one binary input) and / or the binary signal outputs BA (possibly also only one binary output) of the tester 10 automatically configured accordingly (step S2). This includes, for example, the assignment of the predetermined pins Pn for the binary signal inputs and outputs BE, BA at the interface 16 at the test apparatus 10 to specific pins Gm of the interface 17 at the control unit 6, and the definition of the logical content of a binary 0 or 1, eg 0 = no trip, 1 = trip or 0 = no close, 1 = close of the binary input, orO = open, 1 = closed binary output, but also the voltage levels of the binary signal inputs and outputs BE, BA. In addition, the timing of the binary signal inputs BE and / or binary signal outputs BA can also be defined by the stored first configuration data KD1, e.g. How long a trip command must be applied to a binary signal inputs BE of Prüfgeräts10 or how long the switching device 5 requires for switching, which is signaled at ei¬nem binary signal outputs BA.
    Instead of an identification ID, these basic first configuration data KD1 can, of course, also be stored directly in the memory unit 15 and be read out there directly from the tester 10.
    With this basic configuration, a basic function check can already be carried out for the control unit 6 (step S3) in order to check whether the control unit 6 reacts in the over-centered manner to events which are signaled by the test apparatus 10. For example, the following tests are conceivable here:
    The vast majority of switching devices 5 have manually operable switching handles, which make it possible the switching device 5 mechanically to switch by hand, so to open or lock. The respective switching position is signaled via the auxiliary switch contacts to zugeord¬neten binary outputs of the switching device 5 to the control unit 6. This can now be simulated in the basic functional test with the switching device simulator in the test apparatus 10. On the test apparatus 10, TRIP and CLOSE buttons can be provided for this purpose, by means of which a specific switch position can be sensibly monitored on the binary signal outputs BA, Dahni can be nfisnhaltat with ninnm Tastaria Phasnn nlairh7Pitin nfisnhaltat, or it can also individual buttons for the different phases Consequently, it suffices if at least one binary signal output BA of the test apparatus 10 is configured.
    Of course, depending on the type and type of switching devices 5, it may also be necessary to configure a plurality of binary signal outputs BA of the tester 10 for a basic functional test. In any case, a valid signal must be present on all binary signal outputs BA whose configuration is predetermined by the control unit 6 for the functional test. If the switching device 5 has, for example, a switch auxiliary contact for the trip display and a switch auxiliary contact for the close display, then the associated binary signal outputs BA must always be opposite, ie an open trip would cause a close at Close. But there are also switching devices 5, which have only one Schal¬terhilfskontakt. In this case, a binary signal output BA would be sufficient. But assuming a 3-phase switching device 5, which can be operated 1-phase (ie a switching action forcibly switches all phases simultaneously), so a single binary signal output BA is not enough, because the other phases must have a valid status, which signals accordingly must become. For the basic function test but could also be used on the control unit 6 existing switches or buttons for the manual triggering of a switching operation. The switching action desired by the control unit 6 is signaled to the test apparatus 10 on a binary signal input BE, which then switches the assigned phase (or, if appropriate, all phases). The performed switching operation is signaled to the control unit 6 via a binary signal output B of the tester 10, possibly also according to the stored timings for the auxiliary switch contacts. For such a basic functional test, therefore, one is completely independent of an external test software and of the configuration of other, in particular analog, signal inputs and / or signal outputs. If this basic functional test fails, it is unnecessary to carry out further tests and the test can be aborted with an error message. For a test which goes beyond the basic functional test, if such a test is desired, the test apparatus 10 may need to be parameterized by means of further second configuration data KD2 in order to be able to simulate the switching device 5 in its entire functionality (step S5). In this case, the test apparatus 10 must in particular be set up so that any further analog signal outputs AA of the test apparatus 10 are correctly parameterized. For example, voltages or currents are transmitted to the control unit 6 via analog signal outputs AA, which are measured on the real switching device 5 and which consequently have to be simulated by the tester 10 for the test. For this purpose, 10 power and / or voltage amplifiers may be installed in the test apparatus, which must be parameterized (for example, which amplifier is used, voltage / current range, nominal values, etc.) to the currents required for the replica of the switching device 5 and deliver tension. Also included in the switching device 5 are measuring sensors, e.g. Current transformers or voltage sensors can be reproduced in the test apparatus 10, which may also necessitate a parameterization (for example the conversion ratio of a current transformer, the measuring range of a voltage sensor, etc.).
    The second configuration data KD2 necessary for this purpose can in turn be read out of the configuration data memory 18 via the unique identification ID or can be read out directly from the memory unit 15 if they are stored there.
    Depending on the functional scope of the control unit 6, more or fewer analog signal inputs AE and / or analog signal outputs AA can be parameterized. Therefore, for this kind of check, it may be necessary to select the concomitantly used control unit 6, if there can be several control units 6 for a given identification ID. This selection may be offered to the user of the tester 10.
    By means of the analog signal outputs AA more complex checks of the control unit 6 can be performed (step S5), which also include current and or voltage values of the individual phases of the switching devices 5. To carry out such further testing, special testing software is required, which may be installed either on the test apparatus 10 or on an external control unit 20 (e.g., a PC, laptop, tablet, etc.). Da¬bei also a variety of test plans can be called and processed, even auto¬matisch, the result (error ERROR or successfully passed PASS) can also be mitprotokol¬liert.
    For example, to check current and voltage inputs of the control unit 6, the user may use the external control unit 20 and then connect to the tester 10 via either a wireless or wired connection. Once the connection is made, the tester 10 notifies the test software which adapter cable 11 (identification ID) is connected. The test software then uses the identification ID of the adapter cable 11 and automatically selects the associated control unit 6 via a table stored in the test software or offers the user a list of possible control units 6 for selection. The control units 6 usually have a basic configuration, which can then already be loaded for preconfiguring the test apparatus 10. If necessary, the configuration is supplemented or completed by the user.
    The basic idea of the method according to the invention is therefore that a user, independent of additional testing software, can at least already perform basic functional tests on the control unit 6 without having to completely configure or parameterize a test device 10. This allows the rapid testing of basic functions before a complex configuration is performed. For additional tests, for example during initial startup or during a complete routine test, the test process is greatly simplified since the control unit 6 is automatically selected on the basis of the identified adapter cable 11 in the test software and the test apparatus 10 is at least preconfigured. If an adapter cable 11 is associated with a plurality of control units 6, the selection of the correct control unit 6 for the user can be at least considerably reduced and therefore simplified.
    权利要求:
    Claims (12)
    [1]
    1. Test arrangement for a switchgear (4) with a control unit (6) for a Schaltvor¬richtung (5) of the switchgear (4) and with a tester (10) with a number of signal inputs (BE) and a number of Signal outputs (BA, AA), wherein the control unit (6) via an adapter cable (11) to the test device (10) is connected and the test device (10) for the test the switching device (5) simulates, characterized in that the adapter cable (11 ) a memory unit (15) is provided, on which configuration-specific data are stored and readable by the test apparatus (10) and in that the test apparatus (10) is designed to require its signal inputs (BE) and signal outputs (BA) required for a test. AA) automatically configure according to the configuration-specific data.
    [2]
    2. Test arrangement according to claim 1, characterized in that as configurations¬spezifische data a unique identification (ID) of the adapter cable (11) is stored and in the test arrangement, a configuration data memory (18) is provided in the configuration data (KD) for configuration required signal inputs (BE) and signal outputs (BA, AA) are stored.
    [3]
    3. Test arrangement according to claim 1 or 2, characterized in that as konfigu¬rationsspezifische data configuration data (KD) for the configuration of required signal inputs (BE) and signal outputs (BA, AA) are stored.
    [4]
    4. Test arrangement according to claim 2 or 3, characterized in that first configuration data (KD1) for the configuration of at least one binary signal output (BA) of the tester (10) are stored.
    [5]
    5. Test arrangement according to claim 2 or 3, characterized in that first configuration data (KD1) for the configuration of at least one binary signal input (BE) of the tester (10) are stored.
    [6]
    6. Test arrangement according to claim 2 or 3, characterized in that second Kon¬figurationsdaten (KD2) for the configuration of at least one analog signal output (AA) of the tester (10) are stored.
    [7]
    7. A method for preparing a test of a switchgear (4) with a control unit (6) for a switching device (5) of the switchgear (4), wherein a test device (10) with a number of signal inputs (BE) and a number of Signal outputs (BA, AA) with an adapter cable (11) is connected to the control unit (6) and the test device (10) for the test simulates the switching device (5), characterized in that the test device (10) from a memory unit (15) on the adapter cable (11) configuration-specific data read and the tester (10) so that its required for the implementation of the test Sig¬naleingänge (BE) and signal outputs (BA, AA) configured.
    [8]
    8. The method according to claim 7, characterized in that the test device (10) as configuration-specific data from the memory unit (15) reads a unique identification (ID) of the adapter cable (11) and thus from a configuration data memory (18) configuration data (KD) for configuration of required signal inputs (BE) and signal outputs (BA, AA) reads.
    [9]
    9. The method according to claim 7 or 8, characterized in that the test device (10) as configuration-specific data from the memory unit (15) configuration data (KD) for the configuration of required signal inputs (BE) and signal outputs (BA, AA) reads.
    [10]
    10. The method according to claim 8, wherein the configuration data comprise first configuration data with which at least one binary signal output of the test apparatus is configured.
    [11]
    11. The method according to claim 8, wherein the configuration data comprise first configuration data with which at least one binary signal input of the testing device is configured.
    [12]
    12. The method according to claim 8, wherein the configuration data comprise second configuration data with which at least one analog signal output of the test device is configured.
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    公开号 | 公开日
    PL3204783T3|2021-05-04|
    CA2964025A1|2016-04-14|
    EP3204783A1|2017-08-16|
    KR20170069247A|2017-06-20|
    PT3204783T|2021-01-25|
    RU2017115936A|2018-11-13|
    CA2964025C|2022-01-04|
    RU2017115936A3|2019-01-23|
    US20180238967A1|2018-08-23|
    BR112017006767A2|2017-12-26|
    US10605867B2|2020-03-31|
    ES2846807T3|2021-07-29|
    AT516348B1|2019-11-15|
    MX2017004683A|2017-10-27|
    EP3204783B1|2020-11-04|
    WO2016055307A1|2016-04-14|
    AU2015330242B2|2018-03-15|
    RU2696130C2|2019-07-31|
    MX363410B|2019-03-22|
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    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    AT507162014A|AT516348B1|2014-10-07|2014-10-07|Test arrangement and method for testing a switchgear|AT507162014A| AT516348B1|2014-10-07|2014-10-07|Test arrangement and method for testing a switchgear|
    PT157719360T| PT3204783T|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    RU2017115936A| RU2696130C2|2014-10-07|2015-09-29|Testing device and method for preparing test of switchgear control unit|
    PCT/EP2015/072438| WO2016055307A1|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    KR1020177012205A| KR20170069247A|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    ES15771936T| ES2846807T3|2014-10-07|2015-09-29|Test arrangement and procedure for testing a switching system|
    AU2015330242A| AU2015330242B2|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    CA2964025A| CA2964025C|2014-10-07|2015-09-29|Test set-up and method for testing a substation.|
    MX2017004683A| MX363410B|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system.|
    PL15771936T| PL3204783T3|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    EP15771936.0A| EP3204783B1|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
    BR112017006767A| BR112017006767A2|2014-10-07|2015-09-29|test arrangement and method for testing a switching system|
    US15/517,416| US10605867B2|2014-10-07|2015-09-29|Test arrangement and method for testing a switching system|
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